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Analog and Mixed-Signal CMOS Circuits: The emergence and leadership of a Lab, a reference Book and the future at the core of the A/D Interface in the IoE Conference paper
Martins, Rui P.. Analog and Mixed-Signal CMOS Circuits: The emergence and leadership of a Lab, a reference Book and the future at the core of the A/D Interface in the IoE[C], 2023, 465-468.
Authors:  Martins, Rui P.
Favorite | TC[WOS]:0 TC[Scopus]:0 | Submit date：2024/02/22
Analog And Mixed-signal Vlsi (ams-Vlsi)  Integrated Circuits (Ics)  Internet Of Everything (Ioe)  State Key Lab (skLab)  
A 12-bit 1GS/s ADC With Background Distortion and Split-ADC-Like Gain Calibration Journal article
Wei, Lai, Zheng, Zihao, Markulic, Nereo, Lagos, Jorge, Martens, Ewout, Martins, Rui Paulo, Zhu, Yan, Craninckx, Jan, Chan, Chi Hang. A 12-bit 1GS/s ADC With Background Distortion and Split-ADC-Like Gain Calibration[J]. IEEE Transactions on Circuits and Systems I: Regular Papers, 2023, 70(12), 4679-4691.
Authors:  Wei, Lai;  Zheng, Zihao;  Markulic, Nereo;  Lagos, Jorge;  Martens, Ewout; et al.
Favorite | TC[WOS]:2 TC[Scopus]:1  IF:5.2/4.5 | Submit date：2024/02/23
Analog-to-digital Converter  Cmos Analog Integrated Circuits  Distortion  Input Buffer  Split-adc-like Calibration  
Evaluation and Perspective of Analog Low-Dropout Voltage Regulators: A Review Journal article
TAN YEE CHYAN, HARIKRISHNAN RAMIAH, S. F. WAN MUHAMAD HATTA, NAI SHYAN LAI, CHEE-CHEOW LIM, YONG CHEN, PUI-IN MAK, RUI P. MARTINS. Evaluation and Perspective of Analog Low-Dropout Voltage Regulators: A Review[J]. IEEE Access, 2022, 10, 114469-114489.
Authors:  TAN YEE CHYAN;  HARIKRISHNAN RAMIAH;  S. F. WAN MUHAMAD HATTA;  NAI SHYAN LAI;  CHEE-CHEOW LIM; et al.
Favorite | TC[WOS]:12 TC[Scopus]:16  IF:3.4/3.7 | Submit date：2023/01/30
Adaptive Biasing  Analog Ldos (Aldo)  Bulk Modulation  Capacitor-less Output  Charge Pump  Flipped Voltage Follower (Fvf)  Linear Low-dropout Regulators (Ldos)  Power Management Integrated Circuits (Pmics)  Power Supply Rejection (Psr)  
An Analog Multiplier Controlled Buck-Boost Converter Journal article
Wen, Sibo, Zeng, Wen Liang, Lam, Chi Seng, Maloberti, Franco, Martins, Rui Paulo. An Analog Multiplier Controlled Buck-Boost Converter[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2022, 69(10), 4173-4177.
Authors:  Wen, Sibo;  Zeng, Wen Liang;  Lam, Chi Seng;  Maloberti, Franco;  Martins, Rui Paulo
Favorite | TC[WOS]:4 TC[Scopus]:4  IF:4.0/3.7 | Submit date：2022/08/05
Analog Multiplier  Boost Mode  Buck Mode  Buck-boost Converter  Lithium Batteries  Logic Circuits  Pulse Width Modulation  Regulation  Switches  Switching Frequency  Switching Loss  
Revisiting the Frontiers of Analog and Mixed-Signal Integrated Circuits Architectures and Techniques towards the future Internet of Everything (IoE) Applications Journal article
Rui P. Martins, Pui-In Mak, Sai-Weng Sin, Man-Kay Law, Yan Zhu, Yan Lu, Jun Yin, Chi-Hang Chan, Yong Chen, Ka-Fai Un, Mo Huang, Minglei Zhang, Yang Jiang, Wei-Han Yu. Revisiting the Frontiers of Analog and Mixed-Signal Integrated Circuits Architectures and Techniques towards the future Internet of Everything (IoE) Applications[J]. Foundations and Trends® in Integrated Circuits and Systems, 2021, 1(2-3), 72-216.
Authors:  Rui P. Martins;  Pui-In Mak;  Sai-Weng Sin;  Man-Kay Law;  Yan Zhu; et al.
Adobe PDF | Favorite |  | Submit date：2022/08/30
Analog-to-digital Converters, Mixed-signal Circuits And Systems, Rf Circuits, Mm-wave Integrated Circuits, Wireless Circuits, Wireline Circuits, Data Converters, Analog-to-digital Converters, Sensors, Analog-to-digital Conversion  
A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems Journal article
Jia, Z., Liu, Z.B., Gan, Y.F., Vong, C. M.. A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems[J]. IEEE Transactions on Industrial Electronics (SCI-E), 2021, 10087-10096.
Authors:  Jia, Z.;  Liu, Z.B.;  Gan, Y.F.;  Vong, C. M.
Favorite |   IF:7.5/8.0 | Submit date：2022/08/09
Analog circuits  deep forest (DF)  diagnosis  failure  fault  
A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems Journal article
Jia, Zhen, Liu, Zhenbao, Gan, Yanfen, Vong, Chi Man, Pecht, Michael. A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems[J]. IEEE Transactions on Industrial Electronics, 2021, 68(10), 10087-10096.
Authors:  Jia, Zhen;  Liu, Zhenbao;  Gan, Yanfen;  Vong, Chi Man;  Pecht, Michael
Favorite | TC[WOS]:36 TC[Scopus]:36  IF:7.5/8.0 | Submit date：2021/12/08
Analog Circuits  Deep Forest (Df)  Diagnosis  Failure  Fault  
A 12b 180MS/s 0.068mm2 with Full-Calibration-Integrated Pipelined-SAR ADC Journal article
Jianyu Zhong, Yan Zhu, Chi-Hang Chan, Sai-Wng Sin, Seng-Pan U, Rui Paulo Martins. A 12b 180MS/s 0.068mm2 with Full-Calibration-Integrated Pipelined-SAR ADC[J]. IEEE Transactions on Circuits and Systems I: Regular Papers, 2017, 64(7), 1684-1695.
Authors:  Jianyu Zhong;  Yan Zhu;  Chi-Hang Chan;  Sai-Wng Sin;  Seng-Pan U; et al.
Favorite | TC[WOS]:23 TC[Scopus]:30 | Submit date：2019/02/11
Analog-to-digital Converter (Adc)  Low Power  Successive Approximation Architecture  Switched-capacitor Circuits  
A 12b 180MS/s 0.068mm(2) With Full-Calibration-Integrated Pipelined-SAR ADC Journal article
Zhong, Jianyu, Zhu, Yan, Chan, Chi-Hang, Sin, Sai-Weng, U, Seng-Pan, Martins, Rui Paulo. A 12b 180MS/s 0.068mm(2) With Full-Calibration-Integrated Pipelined-SAR ADC[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2017, 64(7), 1684-1695.
Authors:  Zhong, Jianyu;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  U, Seng-Pan; et al.
Favorite | TC[WOS]:23 TC[Scopus]:30  IF:5.2/4.5 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Successive Approximation Architecture  Low Power  Switched-capacitor Circuits  
Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
Liu, Z.B., Jia, Z., Vong, C. M., Bu, S.H., Han, J.W., Tang, X.J.. Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning[J]. IEEE Transactions on Industrial Informatics (SCI-E), 2017, 1213-1226.
Authors:  Liu, Z.B.;  Jia, Z.;  Vong, C. M.;  Bu, S.H.;  Han, J.W.; et al.
Favorite |   IF:11.7/11.4 | Submit date：2022/08/09
Analog circuits  deep belief network  deep learning  diagnosis  failure  fault  restricted Boltzmann machines.