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A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems
Jia, Zhen1; Liu, Zhenbao1; Gan, Yanfen2; Vong, Chi Man3; Pecht, Michael4
2021-10-01
Source PublicationIEEE Transactions on Industrial Electronics
ISSN0278-0046
Volume68Issue:10Pages:10087-10096
Abstract

Electronics-rich analog systems are difficult to diagnose owing to their complex working mechanisms and the variability of the working environment. In recent years, deep learning has been gradually applied to the field of circuit system fault diagnosis because of its strong ability to mine the intrinsic characteristics of signals. However, the traditional deep learning method requires a lot of effort to achieve satisfactory results due to large number of parameters, complex models, slow training speed, and large datasets. The key factors for the success of traditional deep learning methods are layer-by-layer processing, feature transformation within the model, and sufficient model complexity. Deep forest (DF) is a new feature learning model that inherits the three characteristics of the traditional deep learning model but is that it is not based on neural network. It has fewer hyperparameters, a simpler model, faster training speed. In this article, an improved DF algorithm based on nonparametric predictive inference (NPI) is proposed, named NPIDF, which can better deal with small sample data. In two typical analog filter circuit fault diagnosis experiments, it is proved that DF and NPIDF achieve good diagnosis effect, and NPIDF performance is better, showing a greater advantage in small sample data.

KeywordAnalog Circuits Deep Forest (Df) Diagnosis Failure Fault
DOI10.1109/TIE.2020.3020252
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaAutomation & Control Systems ; Engineering ; Instruments & Instrumentation
WOS SubjectAutomation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS IDWOS:000670541800097
PublisherAutomation & Control Systems; EngineeringInstruments & Instrumentation
Scopus ID2-s2.0-85102311801
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Faculty of Science and Technology
Corresponding AuthorLiu, Zhenbao
Affiliation1.School of Aeronautics, Northwestern Polytechnical University, Xi'an, 710072, China
2.School of Information Science and Technology, South China Business College, Guangdong University of Foreign Studies, Guangzhou, 510545, China
3.Department of Computer and Information Science, University of Macau, 999078, Macao
4.Center for Advanced Life Cycle Engineering, University of Maryland, College Park, 20742, United States
Recommended Citation
GB/T 7714
Jia, Zhen,Liu, Zhenbao,Gan, Yanfen,et al. A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems[J]. IEEE Transactions on Industrial Electronics, 2021, 68(10), 10087-10096.
APA Jia, Zhen., Liu, Zhenbao., Gan, Yanfen., Vong, Chi Man., & Pecht, Michael (2021). A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems. IEEE Transactions on Industrial Electronics, 68(10), 10087-10096.
MLA Jia, Zhen,et al."A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems".IEEE Transactions on Industrial Electronics 68.10(2021):10087-10096.
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