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Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC Journal article
Wang G., Li C., Zhu Y., Zhong J., Lu Y., Chan C.-H., Martins R.P.. Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC[J]. IEEE Transactions on Circuits and Systems I: Regular Papers, 2018, 65(11), 3707-3719.
Authors:  Wang G.;  Li C.;  Zhu Y.;  Zhong J.;  Lu Y.; et al.
Favorite | TC[WOS]:5 TC[Scopus]:5 | Submit date：2019/02/11
Bridge Dac  Gain Error Calibration  Low-dropout (Ldo) Regulator  Sar Adc  Testing Signal Generation  
Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC Conference paper
Wang, Guancheng, Li, Cheng, Zhu, Yan, Zhong, Jianyu, Lu, Yan, Chan, Chi-Hang, Martins, Rui P.. Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC[C], 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2018, 3707-3719.
Authors:  Wang, Guancheng;  Li, Cheng;  Zhu, Yan;  Zhong, Jianyu;  Lu, Yan; et al.
Favorite | TC[WOS]:5 TC[Scopus]:5 | Submit date：2018/10/30
Gain Error Calibration  Testing Signal Generation  Sar Adc  Bridge Dac  Low-dropout (Ldo) Regulator  
Gain-Error-Calibrations for Two-step ADCs: Optimizations either in Accuracy or Chip Area Journal article
Wang, G. C., Zhu, Y., Chan, C. H., Martins, R. P.. Gain-Error-Calibrations for Two-step ADCs: Optimizations either in Accuracy or Chip Area[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2018, 2279-2289.
Authors:  Wang, G. C.;  Zhu, Y.;  Chan, C. H.;  Martins, R. P.
Favorite |   IF:2.8/2.8 | Submit date：2022/01/25
Gain error calibration  testing signal generation  SAR ADC  bridge-DAC  
Quick and cost-efficient A/D converter static characterization using low-precision testing signal Journal article
Qin, Wei Wei, Sin, Sai-Weng, Seng-Pan, U., Martins, Rui Paulo. Quick and cost-efficient A/D converter static characterization using low-precision testing signal[J]. MICROELECTRONICS JOURNAL, 2018, 74, 86-93.
Authors:  Qin, Wei Wei;  Sin, Sai-Weng;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite | TC[WOS]:1 TC[Scopus]:2  IF:1.9/1.7 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Static Characterization Estimation  Adc Testing  Ramp Testing  Nonlinear Input Signal  Attenuated Input Signal  
Quick and cost-efficient A/D converter static characterization using low-precision testing signal Journal article
Qin,Wei Wei, ,Weng, U,Seng Pan, Martins,Rui Paulo. Quick and cost-efficient A/D converter static characterization using low-precision testing signal[J]. Microelectronics Journal, 2018, 74, 86-93.
Authors:  Qin,Wei Wei;  ,Weng;  U,Seng Pan;  Martins,Rui Paulo
Favorite | TC[WOS]:1 TC[Scopus]:2  IF:1.9/1.7 | Submit date：2021/03/09
Adc Testing  Analog-to-digital Converter (Adc)  Attenuated Input Signal  Nonlinear Input Signal  Ramp Testing  Static Characterization Estimation