This paper reports a calibration scheme that can be used to correct the inter-stage gain error in two-stage analog-to-digital converters (ADCs). We measure the static nonlinearity at the raw ADC outputs and compensate it through a feedback path to adjust the gain in the analog domain, which avoids the dynamic range loss in the conventional pure digital calibrations. The proposed scheme detects the error via the missing-code-occurrence probability (MCOP), which is insensitive to the comparator offset and has better immunity to its noise. Besides the gain error, we discuss other DAC linearity issues, such as the implementations of the reference buffer and the low-dropout (LDO) regulator. To verify the MCOP calibration, we design a 12-bit successive-approximation-register ADC, employing the bridge-DAC, in 65-nm CMOS. We integrate the ADC operating at 100 MS/s with the MCOP calibration, the reference buffers, and the LDO. The measurement results demonstrate the linearity enhancement after the proposed calibration, where we improve the signal-to-noise-and-distortion ratio to 61.38 dB, leading to a FoM of 16.7 fJ/conversion step at the Nyquist input frequency.