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Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction Journal article
Ma C.-H., Huang J.-H., Chen H.. Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction[J]. Thin Solid Films, 2002, 418(2), 73-78.
Authors:  Ma C.-H.;  Huang J.-H.;  Chen H.
Favorite | TC[WOS]:246 TC[Scopus]:250 | Submit date:2019/04/08
Cos 2 α Sin 2 ψ Method  Residual Stress  Textured Thin Film