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Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters Conference paper
Qin, WeiWei, Sin, Sai-Weng, Seng-Pan, U., Martins, Rui Paulo, Wang, ZH, Xie, WH. Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters[C], 703 KILMAR CRES, OTTAWA, ONTARIO K2T 0B1, CANADA:CLAUSIUS SCIENTIFIC PR INC, 2017, 218-225.
Authors:  Qin, WeiWei;  Sin, Sai-Weng;  Seng-Pan, U.;  Martins, Rui Paulo;  Wang, ZH; et al.
Favorite | TC[WOS]:0  | Submit date：2018/10/30
Analog To Digital Converter  Test System  Automated  Sweep Function  Labview