Residential College | false |
Status | 已發表Published |
Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters | |
Qin, WeiWei; Sin, Sai-Weng; Seng-Pan, U.; Martins, Rui Paulo; Wang, ZH; Xie, WH | |
2017 | |
Conference Name | 2017 6TH INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND COMPUTER SCIENCE (ICAMCS 2017) |
Pages | 218-225 |
Conference Date | 2017 |
Conference Place | China |
Publication Place | 703 KILMAR CRES, OTTAWA, ONTARIO K2T 0B1, CANADA |
Publisher | CLAUSIUS SCIENTIFIC PR INC |
Abstract | This paper describes an automated test system for Analog to Digital Converters (ADC) combining various instruments controlled by LabVIEW, to implement standard based real-time measurement which accurately characterizes the statistical and dynamic performances. Moreover, the proposed system provides an automated input parameter sweep-function, which realizes the ADC intelligent automation test with different input settings. Virtual Instruments (VIs) were created in system program to control signal generation and data acquisition. The system is not limited to the type or speed of the ADC under test due to its high compatibility and hardware modularity. We describe in detail the hardware arrangement and software programming, as well as the experimental testing of real ADCs, to demonstrate system's performance. |
Keyword | Analog To Digital Converter Test System Automated Sweep Function Labview |
DOI | 10.23977/icames.2017.1028 |
URL | View the original |
Language | 英語English |
WOS Research Area | Engineering ; Materials Science ; Mathematics |
WOS Subject | Engineering, Mechanical ; Materials Science, Multidisciplinary ; Mathematics, Applied |
WOS ID | WOS:000432428300028 |
The Source to Article | WOS |
Fulltext Access | |
Citation statistics | |
Document Type | Conference paper |
Collection | Faculty of Science and Technology |
Corresponding Author | Sin, Sai-Weng |
Recommended Citation GB/T 7714 | Qin, WeiWei,Sin, Sai-Weng,Seng-Pan, U.,et al. Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters[C], 703 KILMAR CRES, OTTAWA, ONTARIO K2T 0B1, CANADA:CLAUSIUS SCIENTIFIC PR INC, 2017, 218-225. |
APA | Qin, WeiWei., Sin, Sai-Weng., Seng-Pan, U.., Martins, Rui Paulo., Wang, ZH., & Xie, WH (2017). Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters. , 218-225. |
Files in This Item: | There are no files associated with this item. |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment