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Self-Adaptive Multiprototype-Based Competitive Learning Approach: A k-Means-Type Algorithm for Imbalanced Data Clustering Journal article
Lu, Yang, Cheung, Yiu Ming, Tang, Yuan Yan. Self-Adaptive Multiprototype-Based Competitive Learning Approach: A k-Means-Type Algorithm for Imbalanced Data Clustering[J]. IEEE Transactions on Cybernetics, 2021, 51(3), 1598-1612.
Authors:  Lu, Yang;  Cheung, Yiu Ming;  Tang, Yuan Yan
Favorite | TC[WOS]:40 TC[Scopus]:51  IF:9.4/10.3 | Submit date：2021/12/07
Class Imbalance Learning  Competitive Learning  Data Clustering  Internal Validation Measure  K-means-type Algorithm  Multiprototype Clustering  
External Learning, Market Dynamics, and Radical Innovation: Evidence from China's High-Tech Firms Journal article
Bao, Y.C., Chen, X. Y., Zhou, K.Z.. External Learning, Market Dynamics, and Radical Innovation: Evidence from China's High-Tech Firms[J]. Journal of Business Research, 2012, 1226-1233.
Authors:  Bao, Y.C.;  Chen, X. Y.;  Zhou, K.Z.
Favorite |   IF:10.5/11.2 | Submit date：2022/08/29
Externallearning  Technical Learning  Administrative Learning  Radical Innovation  Technological Turbulence  Competitive Intensity  
External learning, market dynamics, and radical innovation: Evidence from China's high-tech firms Journal article
Yongchuan Bao, Xiaoyun Chen, Kevin Zheng Zhou. External learning, market dynamics, and radical innovation: Evidence from China's high-tech firms[J]. Journal of Business Research, 2012, 65(8), 1226-1233.
Authors:  Yongchuan Bao;  Xiaoyun Chen;  Kevin Zheng Zhou
Favorite | TC[WOS]:95 TC[Scopus]:110  IF:10.5/11.2 | Submit date：2018/10/30
Administrative Learning  Competitive Intensity  External Learning  Radical Innovation  Technical Learning  Technological Turbulence  
A reliability design methodology for Chinese character recognition Journal article
Huang Y.S., Liu K., Suen C.Y., Tang Y.Y.. A reliability design methodology for Chinese character recognition[J]. International Journal of Pattern Recognition and Artificial Intelligence, 1998, 12(2), 159-170.
Authors:  Huang Y.S.;  Liu K.;  Suen C.Y.;  Tang Y.Y.
Favorite |  | Submit date：2019/02/11
Competitive learning  OCR  Rejection  Reliable recognition