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	Advances in oxide semiconductors for surface enhanced Raman scattering Journal article Du, Xuejian, Liu, Di, An, Keyu, Jiang, Shouzhen, Wei, Zhixian, Wang, Shuangpeng, Ip, Weng Fai, Pan, Hui. Advances in oxide semiconductors for surface enhanced Raman scattering[J]. Applied Materials Today, 2022, 29. Authors: Du, Xuejian; Liu, Di; An, Keyu; Jiang, Shouzhen; Wei, Zhixian; et al. Favorite \| TC[WOS]:17 TC[Scopus]:18 IF:7.2/7.8 \| Submit date：2023/08/03 Charge transfer Enhancement mechanism Improvement strategies Oxide semiconductors SERS
	Advances in oxide semiconductors for surface enhanced Raman scattering Journal article Du, Xuejian, Liu, Di, An, Keyu, Jiang, Shouzhen, Wei, Zhixian, Wang, Shuangpeng, Ip, Weng Fai, Pan, Hui. Advances in oxide semiconductors for surface enhanced Raman scattering[J]. Applied Materials Today, 2022, 29, 101563. Authors: Du, Xuejian; Liu, Di; An, Keyu; Jiang, Shouzhen; Wei, Zhixian; et al. Favorite \| TC[WOS]:17 TC[Scopus]:18 IF:7.2/7.8 \| Submit date：2023/01/30 Oxide Semiconductors Sers Enhancement Mechanism Charge Transfer Improvement Strategies
	Single-atom sites on perovskite chips for record-high sensitivity and quantification in SERS 钙钛矿上单原子位点实现高灵敏定量化表面拉曼增强 Journal article Ran Feng, Qing Miao, Xiang Zhang, Peixin Cui, Cong Wang, Yibo Feng, Liyong Gan, Jiaxing Fu, Shibo Wang, Ziyi Dai, Liming Hu, Yunjing Luo, Weihai Sun, Xiaoxian Zhang, Jiawen Xiao, Jinbo Wu, Bingpu Zhou, Mingqiang Zou, Dawei He, Xiaoyuan Zhou, Xiaodong Han. Single-atom sites on perovskite chips for record-high sensitivity and quantification in SERS 钙钛矿上单原子位点实现高灵敏定量化表面拉曼增强[J]. Science China Materials, 2022, 65(6), 1601-1614. Authors: Ran Feng; Qing Miao; Xiang Zhang; Peixin Cui; Cong Wang; et al. Favorite \| TC[WOS]:12 TC[Scopus]:13 IF:6.8/6.6 \| Submit date：2022/05/31 Charge-transfer Mechanism In-vitro Diagnosis Lead Halide Perovskite Point-of-care Testing Sers Single-atom Site

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