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Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope Conference paper
Ice G.E., Larson B.C., Walker F.J., Chung K.-S., Yang W., Budai J.D., Tischler J.Z., Tamura N., Chen H., Chung J.-S., Lowe W.. Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope[C], 2000, 402-407.
Authors:  Ice G.E.;  Larson B.C.;  Walker F.J.;  Chung K.-S.;  Yang W.; et al.
Favorite |  | Submit date：2019/04/08