Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope

Status	已發表Published
	Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope
	Ice G.E.1; Larson B.C.1; Walker F.J.1; Chung K.-S.1; Yang W.1; Budai J.D.1; Tischler J.Z.1; Tamura N.1; Chen H.3; Chung J.-S.3; Lowe W.2
	2000-12-01
Source Publication	ASM Proceedings: Heat Treating
Volume	1
Pages	402-407
Abstract	Characterization of stress has long been recognized as essential for the prediction of materials behavior. However, direct three-dimensional (3-D) measurements of sub-grain microscopic stress tensor distributions have not been available to guide theories of mesoscale dynamics. Here we report on advances in software and instrumentation that make it possible to determine 3-D stress tensor distributions in polycrystalline materials with a spatial resolution below the grain size of most materials. Based on the success of a prototype, a powerful 3-D x-ray crystal microscope is now being constructed to push stress measurements to gauge volumes less than 0.25 cubic microns. The UnicatII beamline 34-ID microscope will provide new information certain to challenge emerging models of mesoscale dynamics and to identify and quantify previously hidden mesoscopic processes.
URL	View the original
Language	英語English
Fulltext Access	View Full-Text via Scopus
Document Type	Conference paper
Collection	University of Macau
Affiliation	1.Oak Ridge National Laboratory 2.Howard University 3.University of Illinois at Urbana-Champaign
Recommended Citation GB/T 7714	Ice G.E.,Larson B.C.,Walker F.J.,et al. Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope[C], 2000, 402-407.
APA	Ice G.E.., Larson B.C.., Walker F.J.., Chung K.-S.., Yang W.., Budai J.D.., Tischler J.Z.., Tamura N.., Chen H.., Chung J.-S.., & Lowe W. (2000). Sub-Grain Measurement of Stress with a 3-D X-Ray Microscope. ASM Proceedings: Heat Treating, 1, 402-407.

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