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GUO JINGZHI [1]
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2003 [1]
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Measurement models for survivability and competitiveness of very large E-marketplace
Journal article
Jingzhi Guo, Chengzheng Sun. Measurement models for survivability and competitiveness of very large E-marketplace[J]. COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS, 2003, 2658, 802-811.
Authors: ; et al.
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Submit date：2019/02/13
