Residential College | false |
Status | 已發表Published |
Measurement models for survivability and competitiveness of very large E-marketplace | |
Jingzhi Guo; Chengzheng Sun | |
2003-12-01 | |
Source Publication | COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS |
ISSN | 3-540-40195-4 |
Volume | 2658Pages:802-811 |
Abstract | E-Marketplace is a man-made profit center with emergent customer requirements. This emergence nature poses many difficulties for e-marketplace to satisfy its customers and thus affects its survivability and competitiveness. To challenge this issue, this paper has introduced a novel emergent e-marketplace model, and analyzed and quantified the emergent properties of e-marketplace from simple ESMs to very large complex electronic intermediary EIMs. The measurement models developed in this paper are very useful for producing dynamic interaction records appropriate for further simulation model of e-marketplaces. © Springer-Verlag Berlin Heidelberg 2003. |
DOI | 10.1007/3-540-44862-4_87 |
URL | View the original |
Indexed By | SCIE |
Language | 英語English |
WOS Research Area | Computer Science |
WOS Subject | Computer Science, Interdisciplinary Applications ; Computer Science, Software Engineering ; Computer Science, Theory & Methods |
WOS ID | WOS:000184831800087 |
Scopus ID | 2-s2.0-35248813050 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | DEPARTMENT OF COMPUTER AND INFORMATION SCIENCE |
Affiliation | School of Computing and Information Technology, Griffith University, Nathan, QLD, Australian |
Recommended Citation GB/T 7714 | Jingzhi Guo,Chengzheng Sun. Measurement models for survivability and competitiveness of very large E-marketplace[J]. COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS, 2003, 2658, 802-811. |
APA | Jingzhi Guo., & Chengzheng Sun (2003). Measurement models for survivability and competitiveness of very large E-marketplace. COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS, 2658, 802-811. |
MLA | Jingzhi Guo,et al."Measurement models for survivability and competitiveness of very large E-marketplace".COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS 2658(2003):802-811. |
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