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Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning
Journal article
Liu, Z.B., Jia, Z., Vong, C. M., Bu, S.H., Han, J.W., Tang, X.J.. Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning[J]. IEEE Transactions on Industrial Informatics (SCI-E), 2017, 1213-1226.
Authors:
Liu, Z.B.
;
Jia, Z.
;
Vong, C. M.
;
Bu, S.H.
;
Han, J.W.
; et al.
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Submit date：2022/08/09
Analog circuits
deep belief network
deep learning
diagnosis
failure
fault
restricted Boltzmann machines.
