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INSTITUTE OF APP... [3]
Authors
TANG ZIKANG [2]
NG KAR WEI [2]
WANG SHUANGPENG [1]
Document Type
Journal article [3]
Date Issued
2024 [1]
2021 [2]
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英語English [3]
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ACS Applied Mate... [1]
ACS Applied Mate... [1]
Journal of the E... [1]
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SCIE [3]
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Surface selective oxidation of C/C composites by ultrafast high-temperature shock for enhancing interfacial bonding with metal
Journal article
Yan, Yaotian, Zhang, Jingkang, Zhang, Tianlei, Zhang, Junjie, Li, Peixin, Wang, Bin, Lin, Jinghuang, Cao, Jian, Qi, Junlei. Surface selective oxidation of C/C composites by ultrafast high-temperature shock for enhancing interfacial bonding with metal[J]. Journal of the European Ceramic Society, 2024, 44(5), 3121-3130.
Authors:
Yan, Yaotian
;
Zhang, Jingkang
;
Zhang, Tianlei
;
Zhang, Junjie
;
Li, Peixin
; et al.
Favorite
|
TC[WOS]:
2
TC[Scopus]:
2
IF:
5.8
/
5.7
|
Submit date:2024/02/22
C/c Composites
Interfacial Bonding
Low Thermal Damage
Surface Selective Oxidation
Ultrafast High-temperature Shock
Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN
Journal article
Liu, R.J., Dong, J.Y., Wang, M.W., Yuan, Q.L., Ji, W.Y., Xu, J.C., Liu, W.W., Su, S.C., Ng, K.W., Tang, Z.K., Wang, S.P.. Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN[J]. ACS Applied Materials & Interfaces, 2021, 13(41), 49058-49065.
Authors:
Liu, R.J.
;
Dong, J.Y.
;
Wang, M.W.
;
Yuan, Q.L.
;
Ji, W.Y.
; et al.
Favorite
|
TC[WOS]:
1
TC[Scopus]:
1
|
Submit date:2022/08/01
Qled
Interface
Thermal Damage
Interlayer
Current Efficiency
Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN
Journal article
Liu, Ren Jun, Dong, Jia Yi, Wang, Meng Wei, Yuan, Qi Lin, Ji, Wen Yu, Xu, Jin Cheng, Liu, Wei Wei, Su, Shi Chen, Ng, Kar Wei, Tang, Zi Kang, Wang, Shuang Peng. Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN[J]. ACS Applied Materials and Interfaces, 2021, 13(41), 49058-49065.
Authors:
Liu, Ren Jun
;
Dong, Jia Yi
;
Wang, Meng Wei
;
Yuan, Qi Lin
;
Ji, Wen Yu
; et al.
Favorite
|
TC[WOS]:
1
TC[Scopus]:
1
IF:
8.3
/
8.7
|
Submit date:2021/12/08
Current Efficiency
Interface
Interlayer
Qled
Thermal Damage