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Quick and cost-efficient A/D converter static characterization using low-precision testing signal Journal article
Qin, Wei Wei, Sin, Sai-Weng, Seng-Pan, U., Martins, Rui Paulo. Quick and cost-efficient A/D converter static characterization using low-precision testing signal[J]. MICROELECTRONICS JOURNAL, 2018, 74, 86-93.
Authors:  Qin, Wei Wei;  Sin, Sai-Weng;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite | TC[WOS]:1 TC[Scopus]:2  IF:1.9/1.7 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Static Characterization Estimation  Adc Testing  Ramp Testing  Nonlinear Input Signal  Attenuated Input Signal  
Quick and cost-efficient A/D converter static characterization using low-precision testing signal Journal article
Qin,Wei Wei, ,Weng, U,Seng Pan, Martins,Rui Paulo. Quick and cost-efficient A/D converter static characterization using low-precision testing signal[J]. Microelectronics Journal, 2018, 74, 86-93.
Authors:  Qin,Wei Wei;  ,Weng;  U,Seng Pan;  Martins,Rui Paulo
Favorite | TC[WOS]:1 TC[Scopus]:2  IF:1.9/1.7 | Submit date：2021/03/09
Adc Testing  Analog-to-digital Converter (Adc)  Attenuated Input Signal  Nonlinear Input Signal  Ramp Testing  Static Characterization Estimation