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Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode Journal article
Tang H., Li Y.. Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode[J]. IEEE Transactions on Industrial Electronics, 2014, 61(3), 1475.
Authors:  Tang H.;  Li Y.
Favorite | TC[WOS]:140 TC[Scopus]:150 | Submit date：2018/10/30
Active Disturbance Rejection Control  Atomic Force Microscope (Afm)  Lever Displacement Amplifiers (Ldas)  Micro-/nanopositioning System  Plant Uncertainties  
Design, analysis, and test of a novel 2-DOF nanopositioning system driven by dual mode Journal article
Hui Tang, Yangmin Li. Design, analysis, and test of a novel 2-DOF nanopositioning system driven by dual mode[J]. IEEE Transactions on Robotics, 2013, 29(3), 650-662.
Authors:  Hui Tang;  Yangmin Li
Favorite | TC[WOS]:110 TC[Scopus]:133  IF:9.4/9.9 | Submit date：2018/10/30
Active Disturbance Rejection Controller (Adrc)  Atomic Force Microscope (Afm)  Dual Mode  Nanopositioning System  Plant Uncertainties