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Growth and dielectric properties of Pb(ScTa)1-xTi xO3 (PSTT) thin films by MOCVD method Journal article
Lin C.-H., Friddle P.A., Ma C.-H., Chen H.. Growth and dielectric properties of Pb(ScTa)1-xTi xO3 (PSTT) thin films by MOCVD method[J]. Tamkang Journal of Science and Engineering, 2002, 5(1), 1-6.
Authors:  Lin C.-H.;  Friddle P.A.;  Ma C.-H.;  Chen H.
Favorite |  | Submit date:2019/04/08
Dielectric Properties  MOCVD  PSTT Relaxor Ferroelectric  Thin Films