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Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS Journal article
Chen, Peng, Yin, Jun, Zhang, Feifei, Mak, Pui In, Martins, Rui P., Staszewski, Robert Bogdan. Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS[J]. IEEE Transactions on Circuits and Systems I: Regular Papers, 2022, 69(1), 196-206.
Authors:  Chen, Peng;  Yin, Jun;  Zhang, Feifei;  Mak, Pui In;  Martins, Rui P.; et al.
Favorite | TC[WOS]:5 TC[Scopus]:7  IF:5.2/4.5 | Submit date：2021/09/20
All-digital Pll (adPll)  Build-in Self-test (Bist)  Digital-to-time Converter (Dtc)  Fractional Spur  Jitter  Mismatch  Noise Shaping  Phase/frequency Detector (Pfd)  Phase Frequency Detectors  Self Calibration  Time-to-digital Converter (Tdc).  
A 529-μW Fractional-N All-Digital PLL Using TDC Gain Auto-Calibration and an Inverse-Class-F DCO in 65-nm CMOS Journal article
Chen, Peng, Meng, Xi, Yin, Jun, Mak, Pui In, Martins, Rui P., Staszewski, Robert Bogdan. A 529-μW Fractional-N All-Digital PLL Using TDC Gain Auto-Calibration and an Inverse-Class-F DCO in 65-nm CMOS[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2022, 69(1), 51-63.
Authors:  Chen, Peng;  Meng, Xi;  Yin, Jun;  Mak, Pui In;  Martins, Rui P.; et al.
Favorite | TC[WOS]:16 TC[Scopus]:15  IF:5.2/4.5 | Submit date：2021/09/20
Adpll  Bluetooth Le (bLe)  Dco  Fractionaln Pll  Phase Noise (Pn)  Tdc  Dtc  Inverse-class-f  Low Power  The Iot  
529-μW Fractional-N All-Digital PLL Using TDC Gain Auto-Calibration and an Inverse-Class-F DCO in 65-nm CMOS Journal article
Chen, P., Meng, X., Yin, J., Mak, P. I., Martins, R. P., Staszewski, R. B.. 529-μW Fractional-N All-Digital PLL Using TDC Gain Auto-Calibration and an Inverse-Class-F DCO in 65-nm CMOS[J]. IEEE Transactions on Circuits and Systems I: Regular Papers.
Authors:  Chen, P.;  Meng, X.;  Yin, J.;  Mak, P. I.;  Martins, R. P.; et al.
Favorite |   IF:5.2/4.5 | Submit date：2022/01/25
ADPLL  Bluetooth LE (BLE)  DCO  fractionalN PLL  phase noise (PN)  TDC  DTC  inverse-class-F  low power  the IoT