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In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus Journal article
Yao, Fenfa, Cai, Yongqing, Xiao, Zhangru, Zhang, Gang, Xie, Rong Jun, Jin, Chuanhong. In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus[J]. 2D Materials, 2021, 8(2), 025004.
Authors:  Yao, Fenfa;  Cai, Yongqing;  Xiao, Zhangru;  Zhang, Gang;  Xie, Rong Jun; et al.
Favorite | TC[WOS]:7 TC[Scopus]:13  IF:4.5/5.4 | Submit date：2021/10/02
Vacancy Defects  Monolayer Black Phosphorus  Transmission Electron Microscopy