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Journal article [1]
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2017 [1]
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英語English [1]
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MATERIALS CHEMIS... [1]
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Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods
Journal article
Lei, Soichan, Huang, Jia-Hong, Chen, Haydn. Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods[J]. MATERIALS CHEMISTRY AND PHYSICS, 2017, 199, 185-192.
Authors:
Lei, Soichan
;
Huang, Jia-Hong
;
Chen, Haydn
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TC[WOS]:
15
TC[Scopus]:
16
IF:
4.3
/
4.1
|
Submit date：2018/10/30
Ti Interlayer
Tin
Residual Stress
Average X-ray Strain
Synchrotron X-ray
