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Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN Journal article
Liu, R.J., Dong, J.Y., Wang, M.W., Yuan, Q.L., Ji, W.Y., Xu, J.C., Liu, W.W., Su, S.C., Ng, K.W., Tang, Z.K., Wang, S.P.. Efficiency Improvement of Quantum Dot Light-Emitting Diodes via Thermal Damage Suppression with HATCN[J]. ACS Applied Materials & Interfaces, 2021, 13(41), 49058-49065.
Authors:  Liu, R.J.;  Dong, J.Y.;  Wang, M.W.;  Yuan, Q.L.;  Ji, W.Y.; et al.
Favorite | TC[WOS]:1 TC[Scopus]:1 | Submit date:2022/08/01
Qled  Interface  Thermal Damage  Interlayer  Current Efficiency