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Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes
Journal article
Ho, Sut Kam, Garcia, Dario Machado. Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes[J]. APPLIED SPECTROSCOPY, 2017, 71(4), 735-743.
Authors:
Ho, Sut Kam
;
Garcia, Dario Machado
Favorite
|
TC[WOS]:
3
TC[Scopus]:
3
IF:
2.2
/
2.9
|
Submit date：2018/10/30
Indium Tin Oxide
Ito
Ito Film
Laser-excited Atomic Fluorescence
Leaf
Destructiveness
Thin-film Analysis
Erratum to: Guidelines for the use and interpretation of assays for monitoring autophagy (3rd edition) (Autophagy, 12, 1, 1-222, 10.1080/15548627.2015.1100356
Other
2016-01-01
Authors:
Klionsky, Daniel J.
;
Abdelmohsen, Kotb
;
Abe, Akihisa
;
Abedin, Md Joynal
;
Abeliovich, Hagai
; et al.
Favorite
|
TC[WOS]:
407
TC[Scopus]:
24
|
Submit date：2022/07/20
