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Ultrathin Niobium-Doped Indium Oxide Active Layer Enables High-Performance Phototransistors for Driving Quantum-Dot Light-Emitting Diodes Journal article
Lin, Jianrong, Fang, Wenhui, Tan, Haixing, Zhang, Haojun, Dai, Jingfei, Liu, Ziqing, Liu, Si, Chen, Jianwen, Wu, Runfeng, Xu, Hua, Ng, Kar Wei, Xiao, Peng, Liu, Baiquan. Ultrathin Niobium-Doped Indium Oxide Active Layer Enables High-Performance Phototransistors for Driving Quantum-Dot Light-Emitting Diodes[J]. Laser and Photonics Reviews, 2024.
Authors:  Lin, Jianrong;  Fang, Wenhui;  Tan, Haixing;  Zhang, Haojun;  Dai, Jingfei; et al.
Favorite | TC[WOS]:0 TC[Scopus]:0  IF:9.8/11.1 | Submit date：2024/07/04
Amqled  Broad Spectral Responsivity  High Mobility  Innbo  Phototransistor  
Depression and anxiety symptoms are related to problematic smartphone use severity in Chinese young adults: Fear of missing out as a mediator Journal article
Elhai,Jon D., Yang,Haibo, Fang,Jianwen, Bai,Xuejun, Hall,Brian J.. Depression and anxiety symptoms are related to problematic smartphone use severity in Chinese young adults: Fear of missing out as a mediator[J]. Addictive Behaviors, 2020, 101, 105962.
Authors:  Elhai,Jon D.;  Yang,Haibo;  Fang,Jianwen;  Bai,Xuejun;  Hall,Brian J.
Favorite | TC[WOS]:168 TC[Scopus]:186  IF:3.7/3.8 | Submit date：2019/06/25
Fear Of Missing Out  Internet Addiction  Problematic Smartphone Use  
Depression and anxiety symptoms are related to problematic smartphone use severity in Chinese young adults: Fear of missing out as a mediator Journal article
Elhai,Jon D., Yang,Haibo, Fang,Jianwen, Bai,Xuejun, Hall,Brian J.. Depression and anxiety symptoms are related to problematic smartphone use severity in Chinese young adults: Fear of missing out as a mediator[J]. Addictive Behaviors, 2019, 101, 105962.
Authors:  Elhai,Jon D.;  Yang,Haibo;  Fang,Jianwen;  Bai,Xuejun;  Hall,Brian J.
Favorite | TC[WOS]:168 TC[Scopus]:186  IF:3.7/3.8 | Submit date：2019/06/25
Fear Of Missing Out  Internet Addiction  Problematic Smartphone Use