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Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
Liu, Z.B., Jia, Z., Vong, C. M., Bu, S.H., Han, J.W., Tang, X.J.. Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning[J]. IEEE Transactions on Industrial Informatics (SCI-E), 2017, 1213-1226.
Authors:  Liu, Z.B.;  Jia, Z.;  Vong, C. M.;  Bu, S.H.;  Han, J.W.; et al.
Favorite |   IF:11.7/11.4 | Submit date：2022/08/09
Analog circuits  deep belief network  deep learning  diagnosis  failure  fault  restricted Boltzmann machines.  
BoSCC: Bag of Spatial Context Correlations for Spatially Enhanced 3D Shape Representation Journal article
Han, Z.H., Liu, Z.B., Vong, C. M., Liu, Y.S., Bu, S.H., Han, J.W., Chen, C. L.. BoSCC: Bag of Spatial Context Correlations for Spatially Enhanced 3D Shape Representation[J]. IEEE Transactions on Image Processing (SCI-E), 2017, 3707-3720.
Authors:  Han, Z.H.;  Liu, Z.B.;  Vong, C. M.;  Liu, Y.S.;  Bu, S.H.; et al.
Favorite |   IF:10.8/12.1 | Submit date：2022/08/09
Bag of spatial context correlations  Spatial context correlation  Spatial context  3D shape representations.