Status | 已發表Published |
Coherent depth test scheme in FreePipe | |
Liu, Fang1,2; Huang, Mengcheng2; Liu, Xuehui2; Wu, En-Hua2,3 | |
2010 | |
Source Publication | Proceedings - VRCAI 2010, ACM SIGGRAPH Conference on Virtual-Reality Continuum and Its Application to Industry |
Pages | 265-270 |
Author of Source | Association for Computing Machinery |
Abstract | This paper presents a rasterization rendering pipeline namely FreePipe. The system builds a bridge between the traditional graphics pipelines and the general purpose computing architecture CUDA by taking advantages of both sides. The core of FreePipe is a z-buffer based rasterizer entirely implemented in CUDA. The graphics pipeline can be easily mapped to the CUDA programming model with each stage fully open to the programmers. Within this flexible architecture, we propose a coherent depth test scheme for concurrent capture of both depth and color attributes using the atomicCAS operation in CUDA. The scheme can be easily extended to multiple level for efficient rendering of order independent transparency, which has significant performance improvement over the state-of-the-art methods based on traditional graphics pipelines. Copyright © 2010 by the Association for Computing Machinery, Inc. |
DOI | 10.1145/1900179.1900235 |
Language | 英語English |
Fulltext Access | |
Citation statistics | |
Document Type | Conference paper |
Collection | University of Macau |
Affiliation | 1.SuperComputing Center, Computer Network Information Center, Chinese Academy of Sciences, China; 2.State Key Lab. of Computer Sciences, Institute of Software, Chinese Academy of Sciences, China; 3.University of Macau, China |
Recommended Citation GB/T 7714 | Liu, Fang,Huang, Mengcheng,Liu, Xuehui,et al. Coherent depth test scheme in FreePipe[C]. Association for Computing Machinery, 2010, 265-270. |
APA | Liu, Fang., Huang, Mengcheng., Liu, Xuehui., & Wu, En-Hua (2010). Coherent depth test scheme in FreePipe. Proceedings - VRCAI 2010, ACM SIGGRAPH Conference on Virtual-Reality Continuum and Its Application to Industry, 265-270. |
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