Residential College | false |
Status | 已發表Published |
A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide | |
Liu, Zheng1; Zhu, Lei2; Wu, Qiong Sen2; Xiao, Gao Biao1 | |
2017-07-07 | |
Conference Name | IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 |
Source Publication | 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings |
Conference Date | 7 1, 2015 - 7 3, 2015 |
Conference Place | Suzhou, China |
Author of Source | Institute of Electrical and Electronics Engineers Inc. |
Abstract | In this letter, a numerical short-open-calibration (SOC) technique is developed to be directly integrated with the commercial electromagnetic software for accurate extraction of propagation constant of substrate integrated waveguide (SIW) with longitudinally periodic metallic posts. Short- and open-end circuits can be exactly realized by means of electric and magnetic wall in software respectively. After three distinctive equivalent circuit networks are described for SOC de-embedding procedure. The propagation constants of SIW with different dimensions are extracted. Comparison between our extracted and those reported propagation constant is made to validate our SOC technique. In final, the phase and attenuation constants of SIW are derived to demonstrate the propagation and leakage characteristics of SIW. © 2015 IEEE. |
Keyword | Attenuation And Phase Constants Short-open Calibration (Soc) Substrate Integrated Waveguide (Siw) |
DOI | 10.1109/IMWS-AMP.2015.7325043 |
URL | View the original |
Indexed By | CPCI-S |
Language | 英語English |
WOS Research Area | Engineering ; Telecommunications |
WOS Subject | Engineering, Electrical & Electronic ; Telecommunications |
WOS ID | WOS:000380451700146 |
Scopus ID | 2-s2.0-84962422627 |
Fulltext Access | |
Citation statistics | |
Document Type | Conference paper |
Collection | DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING |
Affiliation | 1.Shanghai Jiao Tong University, Shanghai, China; 2.University of Macau, China |
Recommended Citation GB/T 7714 | Liu, Zheng,Zhu, Lei,Wu, Qiong Sen,et al. A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide[C]. Institute of Electrical and Electronics Engineers Inc., 2017. |
APA | Liu, Zheng., Zhu, Lei., Wu, Qiong Sen., & Xiao, Gao Biao (2017). A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide. 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings. |
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