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A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide
Liu, Zheng1; Zhu, Lei2; Wu, Qiong Sen2; Xiao, Gao Biao1
2017-07-07
Conference NameIEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015
Source Publication2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings
Conference Date7 1, 2015 - 7 3, 2015
Conference PlaceSuzhou, China
Author of SourceInstitute of Electrical and Electronics Engineers Inc.
Abstract

In this letter, a numerical short-open-calibration (SOC) technique is developed to be directly integrated with the commercial electromagnetic software for accurate extraction of propagation constant of substrate integrated waveguide (SIW) with longitudinally periodic metallic posts. Short- and open-end circuits can be exactly realized by means of electric and magnetic wall in software respectively. After three distinctive equivalent circuit networks are described for SOC de-embedding procedure. The propagation constants of SIW with different dimensions are extracted. Comparison between our extracted and those reported propagation constant is made to validate our SOC technique. In final, the phase and attenuation constants of SIW are derived to demonstrate the propagation and leakage characteristics of SIW. © 2015 IEEE.

KeywordAttenuation And Phase Constants Short-open Calibration (Soc) Substrate Integrated Waveguide (Siw)
DOI10.1109/IMWS-AMP.2015.7325043
URLView the original
Indexed ByCPCI-S
Language英語English
WOS Research AreaEngineering ; Telecommunications
WOS SubjectEngineering, Electrical & Electronic ; Telecommunications
WOS IDWOS:000380451700146
Scopus ID2-s2.0-84962422627
Fulltext Access
Citation statistics
Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Affiliation1.Shanghai Jiao Tong University, Shanghai, China;
2.University of Macau, China
Recommended Citation
GB/T 7714
Liu, Zheng,Zhu, Lei,Wu, Qiong Sen,et al. A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide[C]. Institute of Electrical and Electronics Engineers Inc., 2017.
APA Liu, Zheng., Zhu, Lei., Wu, Qiong Sen., & Xiao, Gao Biao (2017). A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide. 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings.
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