This article presents a single-channel 3.3-GS/s 6-b pipelined analog-to-digital converter (ADC), which features a post-amplification residue generation (PARG) scheme, linearized dynamic amplifier (DA), and on-chip calibration to achieve a high speed, low power, and compact prototype. The PARG scheme allows the quantization and amplification to run in parallel for a fast pipelining operation. The 6-b ADC consists of six pipelined stages with six comparators and five amplifiers in total. Such a small number of hardware reduce the overhead from the calibration and enable fully on-chip implementation. By further sharing the calibration hardware between the offset and gain calibration, the ADC with on-chip calibration only occupies 0.0166 mm² in 28-nm CMOS. With a linearized DA for the residue amplification, the ADC achieves 34-dB signal-to-noise and distortion ratio (SNDR) with a Nyquist input with 3.3 GS/s, consuming 5.5 mW and yielding a 40.02-fJ/conversion-step Walden figure of merit (FoM).