A fully-integrated low-dropout regulator (LDO) with fast transient response and full spectrum power supply rejection (PSR) is proposed to provide a clean supply for noise-sensitive building blocks in wideband communication systems. With the proposed point-of-load LDO, chip-level high-frequency glitches are well attenuated, consequently the system performance is improved. A tri-loop LDO architecture is proposed and verified in a 65 nm CMOS process. In comparison to other fully-integrated designs, the output pole is set to be the dominant pole, and the internal poles are pushed to higher frequencies with only 50 μA of total quiescent current. For a 1.2 V input voltage and 1 V output voltage, the measured undershoot and overshoot is only 43 mV and 82 mV, respectively, for load transient of 0 μA to 10 mA within edge times of 200 ps. It achieves a transient response time of 1.15 ns and the figure-of-merit (FOM) of 5.74 ps. PSR is measured to be better than - 12 dB over the whole spectrum (DC to 20 GHz tested). The prototype chip measures 260 × 90 μm2, including 140 pF of stacked on-chip capacitors. © 2004-2012 IEEE.