Residential College | false |
Status | 已發表Published |
Low-temperature preparation of perovskite Pb(Sc0.5Ta0.5) O3 thin films using MOCVD | |
Liu D.; Chen H. | |
1996 | |
Source Publication | Materials Letters |
ISSN | 0167577X |
Volume | 28Issue:1-3Pages:17-20 |
Abstract | Single perovskite phase Pb(ScTa)O (PST) thin films have been grown using an one-stage MOCVD method. The processing temperature was 600°C. The film structure as a function of Pb/(Sc + Ta) flow ratio was determined using X-ray diffraction (XRD) and scanning electron microscopy (SEM). |
Keyword | Ferroelectric Imaging Lead Scandium Tantalate Low Temperature Deposition Mocvd Perovskite Pyroelectric Silicon Substrates Thin Films |
DOI | 10.1016/0167-577X(96)00029-8 |
URL | View the original |
Language | 英語English |
WOS ID | WOS:A1996VJ82800004 |
Scopus ID | 2-s2.0-0030243168 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | University of Macau |
Affiliation | University of Illinois at Urbana-Champaign |
Recommended Citation GB/T 7714 | Liu D.,Chen H.. Low-temperature preparation of perovskite Pb(Sc0.5Ta0.5) O3 thin films using MOCVD[J]. Materials Letters, 1996, 28(1-3), 17-20. |
APA | Liu D.., & Chen H. (1996). Low-temperature preparation of perovskite Pb(Sc0.5Ta0.5) O3 thin films using MOCVD. Materials Letters, 28(1-3), 17-20. |
MLA | Liu D.,et al."Low-temperature preparation of perovskite Pb(Sc0.5Ta0.5) O3 thin films using MOCVD".Materials Letters 28.1-3(1996):17-20. |
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