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Direct-current field dependence of dielectric properties in B2O3-SiO2 glass doped Ba0.6Sr0.4TiO3 ceramics
Jiwei Z.1; Xi Y.1; Xiaogang C.1; Liangying Z.1; Chen H.2
2002-09-01
Source PublicationJournal of Materials Science
ISSN00222461
Volume37Issue:17Pages:3739-3745
Abstract

The BaSrTiO ceramics doped BO-SiO glass prepared by a sol-gel process the effect of glass content on the DC field dependence of dielectric characteristics in BaSrTiO ceramics were studied. The samples were observed and analysed by SEM and X-ray diffraction. The dielectric constant of a BST sample with 1 mol% BO-SiO sintered at 1250°C was as good as that of undoped BST sintered at 1340°C. The dielectric constant samples decreases as the applied DC field increases. The influence of the DC field on the loss factor is much less than that on the dielectric constant. With increasing of the applied voltage, the T was increased and the peaks were surpressed and broadened. With increasing of glass content, the peaks were also surpressed and broadened. The maximum dielectric constant and the percentage change of dielectric constant under a DC field increase.

DOI10.1023/A:1016525712077
URLView the original
Language英語English
WOS IDWOS:000177048800023
Scopus ID2-s2.0-0036735952
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Citation statistics
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.Tongji University
2.City University of Hong Kong
Recommended Citation
GB/T 7714
Jiwei Z.,Xi Y.,Xiaogang C.,et al. Direct-current field dependence of dielectric properties in B2O3-SiO2 glass doped Ba0.6Sr0.4TiO3 ceramics[J]. Journal of Materials Science, 2002, 37(17), 3739-3745.
APA Jiwei Z.., Xi Y.., Xiaogang C.., Liangying Z.., & Chen H. (2002). Direct-current field dependence of dielectric properties in B2O3-SiO2 glass doped Ba0.6Sr0.4TiO3 ceramics. Journal of Materials Science, 37(17), 3739-3745.
MLA Jiwei Z.,et al."Direct-current field dependence of dielectric properties in B2O3-SiO2 glass doped Ba0.6Sr0.4TiO3 ceramics".Journal of Materials Science 37.17(2002):3739-3745.
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