Status | 已發表Published |
High frequency characterization for the single-walled carbon nanorubes using S-parameter | |
Zhang M.; Huo X.; Liang Q.; Tang Z.K.; Chan P.C.H. | |
2004-12-01 | |
Source Publication | 2004 4th IEEE Conference on Nanotechnology |
Pages | 107-109 |
Abstract | Metallic Carbon Nanotube (CNT) is a potential material for nano-scale transmission lines as well as high performance passive components in nano-scale systems. Single-walled carbon nanotubes (SWCNTs) were grown using CVD technique. Ti and Au were used for metal nodes. The characterization and analysis for metallic SWCNTs at GHz range are carried out in this paper. The S parameters of CNTs measured using network analyzer are reported for the first time. ©2004 IEEE. |
Keyword | Carbon Nanotube High frequency Nanotechnology Semiconductor devices |
URL | View the original |
Language | 英語English |
Fulltext Access | |
Document Type | Conference paper |
Collection | University of Macau |
Affiliation | Hong Kong University of Science and Technology |
Recommended Citation GB/T 7714 | Zhang M.,Huo X.,Liang Q.,et al. High frequency characterization for the single-walled carbon nanorubes using S-parameter[C], 2004, 107-109. |
APA | Zhang M.., Huo X.., Liang Q.., Tang Z.K.., & Chan P.C.H. (2004). High frequency characterization for the single-walled carbon nanorubes using S-parameter. 2004 4th IEEE Conference on Nanotechnology, 107-109. |
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