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Imaging 0.4 nm single-walled carbon nanotubes with atomic force microscopy
Zhang X.; Ye J.; Yang H.; Zhang C.; Ho K.M.; Su T.; Wang N.; Tang Z.; Xiao X.
2007-08-01
Conference NameAsia-Pacific Conference on Surface Science and Engineering
Source PublicationSurface Review and Letters
Volume14
Issue4
Pages687-692
Conference DateDEC 19-21, 2006
Conference PlaceHong Kong, PEOPLES R CHINA
Abstract

The discovery of the single-walled carbon nanotubes (SWCNTs) with a, diameter of 0.4 nm has attracted extensive attentions. In this paper we report our attempt with two methods to directly observe these SWCNTs by AFM. The first one is to deposit the SWCNTs extracted from the zeolite matrix to a flat surface for AFM observation. While one-dimensional features have been observed, the SWCNT was suspected not to adhere well to the substrate. To overcome the difficulties of weak adhesion, we attempt to expose only part of the SWCNT from the zeolite channel by cutting the zeolite crystal at an angle. This alternative method, in which the SWCNT contained zeolite crystal is polished and etched by HCl, however, did not result in a smooth enough surface and thus no one-dimensional features can be observed. The difficulties in sample preparation and possible improvements are discussed. © World Scientific Publishing Company.

KeywordAtomic Force Microscopy Single-walled Carbon Nanotubes
DOI10.1142/S0218625X07009931
URLView the original
Language英語English
WOS IDWOS:000251387500029
Scopus ID2-s2.0-34548445891
Fulltext Access
Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
AffiliationHong Kong University of Science and Technology, William Mong Institute of Nano Science & Technology
Recommended Citation
GB/T 7714
Zhang X.,Ye J.,Yang H.,et al. Imaging 0.4 nm single-walled carbon nanotubes with atomic force microscopy[C], 2007, 687-692.
APA Zhang X.., Ye J.., Yang H.., Zhang C.., Ho K.M.., Su T.., Wang N.., Tang Z.., & Xiao X. (2007). Imaging 0.4 nm single-walled carbon nanotubes with atomic force microscopy. Surface Review and Letters, 14(4), 687-692.
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