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Time-Varying ADN Load Modeling Considering the Suppression of the Plateau Phenomenon and Continuous Low-Quality Data
Wang, Peng1; Zhang, Zhenyuan1; Chen, Chenxu2; Huang, Qi3; Dai, Ningyi4; Lee, Wei Jen5
2024-09
Source PublicationIEEE Transactions on Industry Applications
ISSN0093-9994
Volume60Issue:5Pages:7451-7460
Abstract

The time-varying parameter identification of load models has attracted broad attention when large amounts of intermittent distributed generations (DGs) and stochastic loads are integrated into the active distribution network (ADN). However, traditional time-varying load modeling approaches usually develop the load model with the composite load model (CLM) or the synthesis load model (SLM), which are unsuitable for representing the dynamics of the DGs. Moreover, the plateau phenomenon and the continuous low-quality data also reduce the performance of traditional load models with time-varying parameters. Therefore, to address these issues, a novel time-varying load modeling approach with an improved load model and time-varying parameter identification scheme is designed in the paper. Firstly, an improved load model with a parallel SLM and voltage source converter (VSC) is developed to represent the time-varying behavior of modern loads. Then, the target parameters, whose changes produce more considerable variations in model output responses, are selected with trajectory sensitivity to avoid the plateau phenomenon. Also, the Chi-square test and the proposed weighted suppression strategy are utilized to suppress the continuous low-quality data. The simulation results on a system-level ADN model show that the load models developed by the proposed approach could accurately reflect the time-varying properties of modern ADN.

KeywordActive Distribution Network Continuous Low-quality Data Improved Synthesis Load Model Target Parameter Selection Time-varying Parameter Identification
DOI10.1109/TIA.2024.3425822
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Multidisciplinary ; Engineering, Electrical & Electronic
WOS IDWOS:001319511900113
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141
Scopus ID2-s2.0-85198320110
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionFaculty of Science and Technology
THE STATE KEY LABORATORY OF INTERNET OF THINGS FOR SMART CITY (UNIVERSITY OF MACAU)
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Corresponding AuthorZhang, Zhenyuan
Affiliation1.Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
2.State Grid Fujian Fuzhou Electric Power Supply Company, Fuzhou, 350000, China
3.School of Energy Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
4.State Key Laboratory of Internet of Things for Smart City and Department of Electrical and Computer Engineering, University of Macau, Macau 519000, China
5.Department of Electrical Engineering, University of Texas at Arlington, Arlington, TX 76019 USA
Recommended Citation
GB/T 7714
Wang, Peng,Zhang, Zhenyuan,Chen, Chenxu,et al. Time-Varying ADN Load Modeling Considering the Suppression of the Plateau Phenomenon and Continuous Low-Quality Data[J]. IEEE Transactions on Industry Applications, 2024, 60(5), 7451-7460.
APA Wang, Peng., Zhang, Zhenyuan., Chen, Chenxu., Huang, Qi., Dai, Ningyi., & Lee, Wei Jen (2024). Time-Varying ADN Load Modeling Considering the Suppression of the Plateau Phenomenon and Continuous Low-Quality Data. IEEE Transactions on Industry Applications, 60(5), 7451-7460.
MLA Wang, Peng,et al."Time-Varying ADN Load Modeling Considering the Suppression of the Plateau Phenomenon and Continuous Low-Quality Data".IEEE Transactions on Industry Applications 60.5(2024):7451-7460.
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