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A Fully Integrated 48-V GaN Driver Using Parallel-Multistep-Series Reconfigurable Switched-Capacitor Bank Achieving 7.7nC/mm2 On-Chip Bootstrap Driving Density
Xuchu Mu1,2; Yang Jiang1,2; Rui Martins1,2; Pui-In Mak1,2
2024-08
Conference Name2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Source PublicationDigest of Technical Papers - Symposium on VLSI Technology
Conference Date16-20 June 2024
Conference PlaceHonolulu, HI, USA
PublisherInstitute of Electrical and Electronics Engineers Inc.
Abstract

This work presents a fully integrated switched-capacitor (SC) floating-domain gate driver with enhanced driving capability and reduced charge-sharing loss. The proposed driver employs a reconfigurable SC bank (RSCB) to achieve multistep gate driving and minimized bootstrapping capacitance (CBST) area cost. An autonomous switching control determines the reconfiguration of the proposed RSCB by comparing the sensed gate-to-source transient voltage with a triggering level. Fabricated using a 180-nm SOI BCD process, the prototype supports a switching frequency of up to 6MHz and a 48V input for a half-bridge GaN testbench, occupying only 0.048mm 2 of on-chip bootstrap capacitance. The measured delivered gate charge over the C BST area reaches up to 7.7nC/mm 2 , making a 38-fold improvement over conventional techniques, also achieving a 16.2 times reduction in the required C BST area compared to prior designs when driving the same power devices.

DOI10.1109/VLSITechnologyandCir46783.2024.10631361
URLView the original
Indexed BySCIE
Language英語English
Scopus ID2-s2.0-85203600303
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Citation statistics
Document TypeConference paper
CollectionINSTITUTE OF MICROELECTRONICS
Corresponding AuthorYang Jiang
Affiliation1.State Key Laboratory of Analog and Mixed-Signal VLSI, Institute of Microelectronics, University of Macau, Macao
2.ECE Department, Faculty of Science and Technology, University of Macau, Macao
First Author AffilicationUniversity of Macau;  Faculty of Science and Technology
Corresponding Author AffilicationUniversity of Macau;  Faculty of Science and Technology
Recommended Citation
GB/T 7714
Xuchu Mu,Yang Jiang,Rui Martins,et al. A Fully Integrated 48-V GaN Driver Using Parallel-Multistep-Series Reconfigurable Switched-Capacitor Bank Achieving 7.7nC/mm2 On-Chip Bootstrap Driving Density[C]:Institute of Electrical and Electronics Engineers Inc., 2024.
APA Xuchu Mu., Yang Jiang., Rui Martins., & Pui-In Mak (2024). A Fully Integrated 48-V GaN Driver Using Parallel-Multistep-Series Reconfigurable Switched-Capacitor Bank Achieving 7.7nC/mm2 On-Chip Bootstrap Driving Density. Digest of Technical Papers - Symposium on VLSI Technology.
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