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DDIO-Mapping: A Fast and Robust Visual-Inertial Odometry for Low-Texture Environment Challenge
Jiang, Xinyu1; Li, Heng2; Chen, Chuangquan3; Chen, Yongquan2; Huang, Junlang1; Zhou, Zuguang1; Zhou, Yimin4; Vong, Chi Man1
2024-03
Source PublicationIEEE Transactions on Industrial Informatics
ISSN1551-3203
Volume20Issue:3Pages:4418-4428
Abstract

Accurate localization and pose estimation remain challenging for autonomous robots in low-texture environment. This article proposes a tightly coupled direct depth-inertial odometry and mapping (DDIO-Mapping) framework to simultaneously tackle three crucial issues in such environments: 1) ineffective feature point extraction; 2) inefficient searching of feature points; and 3) imbalanced feature extraction under uneven illumination conditions. In DDIO-Mapping, a novel robust strategy is designed that combines grayscale and depth features for optimization instead of only the RBG features in the existing methods. To improve searching efficiency, a new RGBD feature extraction is applied to directly extract both the depth and grayscale features from the RGBD images, which only requires searching the feature points in the 2-D space rather than the enormous 3-D space in K-dimensional (KD) tree. To deal with imbalanced feature extraction, a feature filtering and selection strategy is proposed to adaptively adjust the depth and grayscale weightage. Finally, with the effectively extracted features from RGBD images, a new nonlinear tightly coupled inverse depth residual function is customized to accurately estimate the optimal pose in low-texture environments. The framework is highly robust, accurate, and efficient. Experiments demonstrate that DDIO-Mapping reduces the root-mean-square error by approximately 30% compared to other state-of-the-art algorithms while retaining the same efficiency of approximately 20-35 ms.

Keyword3-d Reconstruction Rgbd Simultaneous Localization And Mapping (Slam) Visual Inertial Odometry Visual Slam
DOI10.1109/TII.2023.3323680
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaAutomation & Control Systems ; Computer Science ; Engineering
WOS SubjectAutomation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial
WOS IDWOS:001092409500001
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141
Scopus ID2-s2.0-85181815372
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Citation statistics
Document TypeJournal article
CollectionFaculty of Science and Technology
DEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Corresponding AuthorChen, Chuangquan; Vong, Chi Man
Affiliation1.University of Macau, Department of Computer and Information Science, Macau, 999078, Macao
2.Chinese Unive. of Hong Kong, Shenzhen Institute of Artificial Intelligence and Robotics for Society, Shenzhen, 518172, China
3.Wuyi University, Faculty of Intelligent Manufacturing, Jiangmen, 529020, China
4.Chinese Academy of Sciences, Shenzhen Institute of Advanced Technology, Shenzhen, 518055, China
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Jiang, Xinyu,Li, Heng,Chen, Chuangquan,et al. DDIO-Mapping: A Fast and Robust Visual-Inertial Odometry for Low-Texture Environment Challenge[J]. IEEE Transactions on Industrial Informatics, 2024, 20(3), 4418-4428.
APA Jiang, Xinyu., Li, Heng., Chen, Chuangquan., Chen, Yongquan., Huang, Junlang., Zhou, Zuguang., Zhou, Yimin., & Vong, Chi Man (2024). DDIO-Mapping: A Fast and Robust Visual-Inertial Odometry for Low-Texture Environment Challenge. IEEE Transactions on Industrial Informatics, 20(3), 4418-4428.
MLA Jiang, Xinyu,et al."DDIO-Mapping: A Fast and Robust Visual-Inertial Odometry for Low-Texture Environment Challenge".IEEE Transactions on Industrial Informatics 20.3(2024):4418-4428.
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