To investigate the operational mechanisms of micrometer-sized light-emitting diodes (micro-LEDs), we here demonstrate a transient methodology of time and spatially resolved electroluminescence spectroscopy (TSR-EL) to measure the spatial distribution of light emission from LED devices. By combining a single-photon camera (SPC) with the time-gated sampling method, we derived the time and spatially resolved electroluminescence intensity with increasing time. Benefiting from the high sensitivity of the SPC, this methodology can detect ultralow electroluminescence (EL) at the delay stage from the device operated around the turn-on voltage. Furthermore, we investigated the spatial light distribution of a typical quantum dots light-emitting diode (QLED) under different applied voltages and varied temperatures. It was found that the EL emission of the QLED device became more uniform with increasing temperature and applied voltage. Moreover, the methodology of TSR-EL is versatile to investigate other LEDs such as organic light-emitting diodes (OLEDs), micro-LEDs, etc.