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FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification
Deng, Shisheng1,2; Liao, Dongping3; Gao, Xitong1; Zhao, Juanjuan1; Ye, Kejiang1
2023
Conference Name32nd International Conference on Artificial Neural Networks (ICANN)
Source PublicationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume14254 LNCS
Pages183-194
Conference DateSEP 26-29, 2023
Conference PlaceHeraklion
PublisherSPRINGER-VERLAG BERLINHEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY
Abstract

Few-shot image classification (FSIC) studies the problem of classifying images when given only a few training samples, which presents a challenge for deep learning models to generalize well on unseen image categories. To learn FSIC tasks effectively, recent metric-based methods leverage the similarity measures of deep feature representations with minimum matching costs, introducing a new paradigm in addressing the FSIC challenge. Recent metric-learning techniques, e.g., DeepEMD, measure the distance between features with the earth mover’s distance (EMD), and it is currently the state-of-the-art (SOTA) approach for FSIC. In this paper, we however identify two fundamental limitations in DeepEMD. First, it brings high computational cost, as it randomly samples image patches to extract features. This process is often wasteful due to suboptimal sampling strategies. Second, its accuracy is also limited by the use of optimal-transport costs based on cosine similarity, which only measures directional discrepancies. To mitigate the above shortcomings, we propose an improved method, which we call FeatEMD. First, it introduces a feature saliency-based cropping (FeatCrop) to construct image patches that concentrates computations on object-salient regions. Second, it proposes a Direction-Distance Similarity (DDS ) a more effective distance criterion in capturing subtle differences in latent space features. We conduct comprehensive experiments and ablations to validate our method. Experimental results show FeatEMD establishes new SOTA on two mainstream benchmark datasets. Remarkably, when compared with DeepEMD, FeatEMD reduces up to 36 % computational costs. Our code is available at https://github.com/SethDeng/FeatEMD.

KeywordFew-shot Image Classification Metric Learning Saliency-based Cropping
DOI10.1007/978-3-031-44207-0_16
URLView the original
Indexed ByCPCI-S
Language英語English
WOS Research AreaComputer Science
WOS SubjectComputer Science, Artificial Intelligence ; Computer Science, Theory & Methods
WOS IDWOS:001156955400016
Scopus ID2-s2.0-85174594684
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Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
Corresponding AuthorYe, Kejiang
Affiliation1.Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518000, China
2.University of Chinese Academy of Sciences, Beijing, 100049, China
3.University of Macau, Macau SAR, 999078, China
Recommended Citation
GB/T 7714
Deng, Shisheng,Liao, Dongping,Gao, Xitong,et al. FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification[C]:SPRINGER-VERLAG BERLINHEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY, 2023, 183-194.
APA Deng, Shisheng., Liao, Dongping., Gao, Xitong., Zhao, Juanjuan., & Ye, Kejiang (2023). FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 14254 LNCS, 183-194.
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