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Structure Suture Learning-Based Robust Multiview Palmprint Recognition
Zhao, Shuping1; Fei, Lunke2; Wen, Jie3; Zhang, Bob1; Zhao, Pengyang4; Li, Shuyi1
2022
Source PublicationIEEE Transactions on Neural Networks and Learning Systems
ISSN2162-237X
Volume35Issue:6Pages:8401-8413
Abstract

Low-quality palmprint images will degrade the recognition performance, when they are captured under the open, unconstraint, and low-illumination conditions. Moreover, the traditional single-view palmprint representation methods have been difficult to express the characteristics of each palm strongly, where the palmprint characteristics become weak. To tackle these issues, in this article, we propose a structure suture learning-based robust multiview palmprint recognition method (SSL_RMPR), which comprehensively presents the salient palmprint features from multiple views. Unlike the existing multiview palmprint representation methods, SSL_RMPR introduces a structure suture learning strategy to produce an elastic nearest neighbor graph (ENNG) on the reconstruction errors that simultaneously exploit the label information and the latent consensus structure of the multiview data, such that the discriminant palmprint representation can be adaptively enhanced. Meanwhile, a low-rank reconstruction term integrating with the projection matrix learning is proposed, in such a manner that the robustness of the projection matrix can be improved. Particularly, since no extra structure capture term is imposed into the proposed model, the complexity of the model can be greatly reduced. Experimental results have proven the superiority of the proposed SSL_RMPR by achieving the best recognition performances on a number of real-world palmprint databases.

KeywordElastic Nearest Neighbor Graph (Enng) Electronic Mail Face Recognition Feature Extraction Image Reconstruction Learning Systems Multiview Learning Neural Networks Palmprint Recognition Palmprint Recognition Structure Suture Learning
DOI10.1109/TNNLS.2022.3227473
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaComputer Science ; Engineering
WOS SubjectComputer Science, Artificial Intelligence ; Computer Science, Hardware & Architecture ; Computer Science, Theory & Methods ; Engineering, Electrical & Electronic
WOS IDWOS:000903572100001
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141
Scopus ID2-s2.0-85146257479
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Corresponding AuthorWen, Jie; Zhang, Bob
Affiliation1.Department of Computer and Information Science, PAMI Research Group, University of Macau, Taipa, China
2.School of Computer Science and Technology, Guangdong University of Technology, Guangzhou, China
3.Shenzhen Key Laboratory of Visual Object Detection and Recognition, Harbin Institute of Technology, Shenzhen, China
4.Department of Electronic Engineering, Tsinghua University, Beijing, China
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Zhao, Shuping,Fei, Lunke,Wen, Jie,et al. Structure Suture Learning-Based Robust Multiview Palmprint Recognition[J]. IEEE Transactions on Neural Networks and Learning Systems, 2022, 35(6), 8401-8413.
APA Zhao, Shuping., Fei, Lunke., Wen, Jie., Zhang, Bob., Zhao, Pengyang., & Li, Shuyi (2022). Structure Suture Learning-Based Robust Multiview Palmprint Recognition. IEEE Transactions on Neural Networks and Learning Systems, 35(6), 8401-8413.
MLA Zhao, Shuping,et al."Structure Suture Learning-Based Robust Multiview Palmprint Recognition".IEEE Transactions on Neural Networks and Learning Systems 35.6(2022):8401-8413.
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