Residential College | false |
Status | 已發表Published |
The Generalization Ability of SVM Classification Based on Markov Sampling | |
Jie Xu1; Yuan Yan Tang,4; Bin Zou2; Zongben Xu3; Luoqing Li2; Yang Lu4; Baochang Zhang5,6 | |
2015-06-01 | |
Source Publication | IEEE Transactions on Cybernetics |
ABS Journal Level | 3 |
ISSN | 21682267 |
Volume | 45Issue:6Pages:1169-1179 |
Abstract | The previously known works studying the generalization ability of support vector machine classification (SVMC) algorithm are usually based on the assumption of independent and identically distributed samples. In this paper, we go far beyond this classical framework by studying the generalization ability of SVMC based on uniformly ergodic Markov chain (u.e.M.c.) samples. We analyze the excess misclassification error of SVMC based on u.e.M.c. samples, and obtain the optimal learning rate of SVMC for u.e.M.c. samples. We also introduce a new Markov sampling algorithm for SVMC to generate u.e.M.c. samples from given dataset, and present the numerical studies on the learning performance of SVMC based on Markov sampling for benchmark datasets. The numerical studies show that the SVMC based on Markov sampling not only has better generalization ability as the number of training samples are bigger, but also the classifiers based on Markov sampling are sparsity when the size of dataset is bigger with regard to the input dimension. |
Keyword | Generalization Ability Learning Rate Markov Sampling Support Vector Machine Classification (Svmc) |
DOI | 10.1109/TCYB.2014.2346536 |
URL | View the original |
Indexed By | SCIE |
Language | 英語English |
WOS Research Area | Automation & Control Systems ; Computer Science |
WOS Subject | Automation & Control Systems ; Computer Science, Artificial Intelligence ; Computer Science, Cybernetics |
WOS ID | WOS:000354532000006 |
Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA |
Scopus ID | 2-s2.0-85027944157 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | University of Macau |
Corresponding Author | Jie Xu; Yuan Yan Tang,; Bin Zou; Zongben Xu; Luoqing Li; Baochang Zhang |
Affiliation | 1.Faculty of Computer Science and Information Engineering, Hubei University, Wuhan 430062, China 2.Faculty of Mathematics and Statistics, Hubei University, Wuhan 430062, China 3.Institute for Information and System Science, Xi’an Jiaotong University, Xi’an 710049, China 4.Faculty of Science and Technology, University of Macau 999078, China 5.School of Automation Science and Electrical Engineering, Beihang University, Beijing 100191, China 6.Pattern Analysis and Computer Vision, Istituto Italiano di Tecnologia, 16163, Genova, Italy |
Corresponding Author Affilication | Faculty of Science and Technology |
Recommended Citation GB/T 7714 | Jie Xu,Yuan Yan Tang,,Bin Zou,et al. The Generalization Ability of SVM Classification Based on Markov Sampling[J]. IEEE Transactions on Cybernetics, 2015, 45(6), 1169-1179. |
APA | Jie Xu., Yuan Yan Tang,., Bin Zou., Zongben Xu., Luoqing Li., Yang Lu., & Baochang Zhang (2015). The Generalization Ability of SVM Classification Based on Markov Sampling. IEEE Transactions on Cybernetics, 45(6), 1169-1179. |
MLA | Jie Xu,et al."The Generalization Ability of SVM Classification Based on Markov Sampling".IEEE Transactions on Cybernetics 45.6(2015):1169-1179. |
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