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Multiple Parameter Decoupling for Resonant MEMS Sensors Exploiting Blue Sideband Excitation
Jingqian Xi1; Lei Xu1; Yuan Wang2; Huafeng Liu1; Xingyin Xiong3; Xudong Zou3; Chengxin Li4; Fangjing Hu1; Chen Wang4; Michael Kraft4; Chun Zhao5
2023-07-19
Source PublicationJournal of Microelectromechanical Systems
ISSN1057-7157
Volume32Issue:5Pages:426 - 436
Abstract

This work reports a multiple-parameter decoupling (MPD) method based on resonant MEMS sensors subject to blue-sideband excitation (BSE), thus enabling simultaneous separation of the cross-coupled physical quantities, e.g. acceleration and temperature, of a single MEMS sensor. Such a technique exploits the property of the BSE that multiple vibration modes of the resonator can be excited at the same time. The proposed MPD algorithm is applied to two distinct resonant MEMS sensors, i.e. a base-line resonant electrostatic force sensor, and a vacuum-packaged resonant MEMS accelerometer. The target measurand of each type of resonant sensor is enveloped by external temperature changes, but the MPD can successfully decouple the measurand from the temperature changes in a single operation. The cross-sensitivity was suppressed by 31 dB and 35 dB for each device, respectively. The decoupled parameters are consistent with the stand-alone measurements, validating the preliminary functionality of the proposed method. The results confirm the merit of the BSE technique for resonant MEMS sensors, and demonstrate significant potential for in-situ temperature fluctuation suppression in high-precision resonant sensors as well as single-device multiple-parameter monitoring.2023-0079

KeywordBlue-sideband Excitation Cross-sensitivity Suppression Micromechanical Devices Multiple Parameter Decoupling Resonant Frequency Resonant Mems Sensors Sensitivity Sensors Temperature Measurement Temperature Sensors Vibrations
DOI10.1109/JMEMS.2023.3293464
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS SubjectEngineering, Electrical & Electronic;nanoscience & Nanotechnology;instruments & Instrumentation;physics, Applied
WOS IDWOS:001035847500001
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC445 HOES LANE, PISCATAWAY, NJ 08855-4141
Scopus ID2-s2.0-85165259337
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Document TypeJournal article
CollectionINSTITUTE OF MICROELECTRONICS
Corresponding AuthorYuan Wang
Affiliation1.PGMF and School of Physics, MOE Key Laboratory of Fundamental Physical Quantities Measurement, and the Hubei Key Laboratory of Gravitation and Quantum Physics, Huazhong University of Science and Technology, Wuhan, China
2.Institute of Microelectronics, University of Macau, Macau, China
3.Aerospace Information Research Institute, State Key Laboratory of Transducer Technology, Chinese Academy of Sciences, Beijing, China
4.Department of Electrical Engineering-MNS, University of Leuven, Leuven, Belgium
5.School of Physics, Engineering and Technology, University of York, Heslington, U.K
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Jingqian Xi,Lei Xu,Yuan Wang,et al. Multiple Parameter Decoupling for Resonant MEMS Sensors Exploiting Blue Sideband Excitation[J]. Journal of Microelectromechanical Systems, 2023, 32(5), 426 - 436.
APA Jingqian Xi., Lei Xu., Yuan Wang., Huafeng Liu., Xingyin Xiong., Xudong Zou., Chengxin Li., Fangjing Hu., Chen Wang., Michael Kraft., & Chun Zhao (2023). Multiple Parameter Decoupling for Resonant MEMS Sensors Exploiting Blue Sideband Excitation. Journal of Microelectromechanical Systems, 32(5), 426 - 436.
MLA Jingqian Xi,et al."Multiple Parameter Decoupling for Resonant MEMS Sensors Exploiting Blue Sideband Excitation".Journal of Microelectromechanical Systems 32.5(2023):426 - 436.
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