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A 0.05mm2- 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS
Tan, Fei; Yu, Wei Han; Un, Ka Fai; Martins, Rui P.; Mak, Pui In
2023-07
Source PublicationIEEE Journal of Solid State Circuits
Document TypeJournal article
CollectionFaculty of Science and Technology
INSTITUTE OF MICROELECTRONICS
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Corresponding AuthorYu, Wei Han
AffiliationUniversity of Macau
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Tan, Fei,Yu, Wei Han,Un, Ka Fai,et al. A 0.05mm2- 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS[J]. IEEE Journal of Solid State Circuits, 2023.
APA Tan, Fei., Yu, Wei Han., Un, Ka Fai., Martins, Rui P.., & Mak, Pui In (2023). A 0.05mm2- 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS. IEEE Journal of Solid State Circuits.
MLA Tan, Fei,et al."A 0.05mm2- 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS".IEEE Journal of Solid State Circuits (2023).
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