This paper presents the design challenges and advanced circuit techniques of integrated gate drivers for non-isolated buck converters using gallium nitride (GaN) devices to achieve fast switching and high conversion efficiency. Focusing on the essential tradeoff considerations, we first explain the detailed circuit-level issues of realizing normal and safe operations regarding integration feasibility, device safety, operation reliability, and power-stage loss alleviation when driving a GaN switch. Accordingly, we review the state-of-the-art techniques for improving various aspects of the performance, including on-chip bootstrapping enhancement, over-voltage and false-switching prevention, electromagnetic interference (EMI) noise suppression, and adaptive driving optimization. We further highlight the feature advantage of distinct techniques in specific performance/function aspects, aiming to bring GaN driver design insights and providing technical references regarding the technical superiority and limitations of improving the overall converter performance.