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A Single-Channel 2.6 GS/s 10b Dynamic Pipelined ADC with Time-Assisted Residue Generation Scheme Achieving Intrinsic PVT Robustness
Junyan Hao1,2; Minglei Zhang1; Yanbo Zhang1,2; Shubin Liu2; Zhangming Zhu2; Yan Zhu1; Chi-Hang Chan1; R. P. Martins1,3
2023-03-23
Conference Name2023 IEEE International Solid-State Circuits Conference (ISSCC)
Source PublicationDigest of Technical Papers - IEEE International Solid-State Circuits Conference
VolumeFebruary 2023
Pages168-169
Conference Date19-23 February 2023
Conference PlaceSan Francisco, CA, USA
CountryUSA
PublisherInstitute of Electrical and Electronics Engineers Inc.
Abstract

 highly integrated wireline receiver with advanced modulation schemes desires multi-GS/s medium-resolution single-channel ADCs with a compact area for mass interleaving. Pipelined SAR ADCs have drawn a lot of attention for their great energy efficiency [1]; however, their conversion rate is still limited due to the serial conversion feature of the SAR quantizer. Benefiting from the highly digital structure with a decent area, time-domain (TD) pipelined ADCs [2] can be a promising alternative. While their competitiveness is reduced when sub-stage resolution is >4b, due to the exponentially increased power and area overhead in the TD flash architecture. To reach an overall 10b target, adding more stages together with high-performance inter-stage amplifiers is necessary, which often constrains the overall conversion rate. Such downside can be resolved by the post-amplification residue generation (PARG) technique in [3] that accelerates the pipeline operation by conducting the quantization and amplification in parallel. While this technique suffers from poor linearity due to the considerable swing in the 1st stage, the ADC can hardly reach >6b resolution. To break the above bottlenecks among speed and resolution, while maintaining a comparable efficiency with the pipelined SAR ADC, this paper presents a time-assisted residue generation (TARG) technique, facilitating a 10b single-channel 2.6GS/s TD pipelined ADC. The TARG-based pipelined ADC facilitates a low-linearity time residue to considerably compress the 1st stage residue transfer time, and simultaneously enables a high-linearity TD PARG, decoupling the tradeoff between linearity and speed of the time residue generation. Furthermore, the inherent complementation characteristic between V-T and T-V conversion in the TARG scheme makes the TD pipelined ADC intrinsically PVT robust without the gain calibration in [2]. Running at 2.6GS/s, the design experiences a 1.55dB SNDR drop under ±5% supply variation and a 1.25dB SNDR loss across -40°C to 85°C

DOI10.1109/ISSCC42615.2023.10067822
URLView the original
Language英語English
Scopus ID2-s2.0-85151681667
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Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
INSTITUTE OF MICROELECTRONICS
Corresponding AuthorMinglei Zhang
Affiliation1.University of Macau,Macao
2.Xidian University, Xi'an, China
3.Instituto Superior Tecnico/University of Lisboa, Lisbon, Portugal
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Junyan Hao,Minglei Zhang,Yanbo Zhang,et al. A Single-Channel 2.6 GS/s 10b Dynamic Pipelined ADC with Time-Assisted Residue Generation Scheme Achieving Intrinsic PVT Robustness[C]:Institute of Electrical and Electronics Engineers Inc., 2023, 168-169.
APA Junyan Hao., Minglei Zhang., Yanbo Zhang., Shubin Liu., Zhangming Zhu., Yan Zhu., Chi-Hang Chan., & R. P. Martins (2023). A Single-Channel 2.6 GS/s 10b Dynamic Pipelined ADC with Time-Assisted Residue Generation Scheme Achieving Intrinsic PVT Robustness. Digest of Technical Papers - IEEE International Solid-State Circuits Conference, February 2023, 168-169.
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