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Wavelet Thinning Algorithm Based Similarity Evaluation for Offline Signature Verification
Bin Fang1; Wen-Sheng Chen2; Xinge You1; Tai-Ping Zhang1; Jing Wen1; Yuan Yan Tang1
2006-09-26
Conference NameInternational Conference on Intelligent Computing (ICIC)
Source PublicationLecture Notes in Control and Information Sciences
Volume345
Pages547-555
Conference DateAUG 16-19, 2006
Conference PlaceKunming, PEOPLES R CHINA
PublisherSPRINGER-VERLAG BERLIN, HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY
Abstract

Structure distortion evaluation is able to allow us directly measure similarity between signature patterns without classification using feature vectors which usually suffers from limited training samples. In this paper, we incorporate merits of both global and local alignment algorithms to define structure distortion using signature skeletons identified by a robust wavelet thinning technique. A weak affine model is employed to globally register two signature skeletons and structure distortion between two signature patterns are determined by applying an elastic local alignment algorithm. Similarity measurement is evaluated in the form of Euclidean distance of all found corresponding feature points. Experimental results showed that the proposed similarity measurement was able to provide sufficient discriminatory information in terms of equal error rate being 18.6% with four training samples. 

DOI10.1007/978-3-540-37258-5_56
URLView the original
Indexed BySCIE ; CPCI-S
Language英語English
WOS Research AreaAutomation & Control Systems ; Computer Science ; Engineering
WOS SubjectAutomation & Control Systems ; Computer Science, Artificial Intelligence ; Computer Science, Information Systems ; Engineering, Electrical & Electronic
WOS IDWOS:000240385300056
Scopus ID2-s2.0-33748860463
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Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
Affiliation1.College of Computer Science, Chongqing University, Chongqing, China
2.Department of MathematicsShenzhen UniversityShenzhenChina
Recommended Citation
GB/T 7714
Bin Fang,Wen-Sheng Chen,Xinge You,et al. Wavelet Thinning Algorithm Based Similarity Evaluation for Offline Signature Verification[C]:SPRINGER-VERLAG BERLIN, HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY, 2006, 547-555.
APA Bin Fang., Wen-Sheng Chen., Xinge You., Tai-Ping Zhang., Jing Wen., & Yuan Yan Tang (2006). Wavelet Thinning Algorithm Based Similarity Evaluation for Offline Signature Verification. Lecture Notes in Control and Information Sciences, 345, 547-555.
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