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Image analysis based on an improved bidimensional empirical mode decomposition method
Zhang D.; Pan J.; Tang Y.Y.
2010-10-28
Conference Name2010 International Conference on Wavelet Analysis and Pattern Recognition
Source Publication2010 International Conference on Wavelet Analysis and Pattern Recognition, ICWAPR 2010
Pages144-149
Conference DateJUL 11-14, 2010
Conference PlaceQingdao, PEOPLES R CHINA
Abstract

The Empirical Mode Decomposition (EMD) is a new adaptive signal decomposition method, which is good at handling many real nonlinear and nonstationary one dimensional signals. It decomposes signals into a a series of Intrinsic Mode Functions (IMFs) that was shown having better behaved instantaneous frequencies via Hilbert transform (The EMD and Hilbert spectrum analysis together were called Hilbert-Huang Transform (HHT) which was proposed by N.E.Huang et at. in [5].). For the advanced applications in image analysis, the EMD was extended to the bidimensional EMD (BEMD). However, most of the existed BEMD algorithms are slow and have unsatisfied results. In this paper, we firstly proposed a new BEMD algorithm which is comparatively faster and better-performed. Then we use the Riesz transform to get the monogenic signals. The local features (amplitude, phase orientation, phase angle, etc) are evaluated. The simulation results are given in the experiments. ©2010 IEEE.

KeywordBidimensional Empirical Mode Decomposition Hilbert Huang Transform Image Analysis
DOI10.1109/ICWAPR.2010.5576310
URLView the original
Language英語English
WOS IDWOS:000287456000027
Scopus ID2-s2.0-77958179756
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Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
AffiliationHong Kong Baptist University
Recommended Citation
GB/T 7714
Zhang D.,Pan J.,Tang Y.Y.. Image analysis based on an improved bidimensional empirical mode decomposition method[C], 2010, 144-149.
APA Zhang D.., Pan J.., & Tang Y.Y. (2010). Image analysis based on an improved bidimensional empirical mode decomposition method. 2010 International Conference on Wavelet Analysis and Pattern Recognition, ICWAPR 2010, 144-149.
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