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Single-pixel phase microscopy without 4f system
Zhao, Ya Nan1; Hou, Hong Yun1; Han, Jia Cheng1; Gao, Shan2; Cui, Sheng Wei2; Cao, De Zhong3; Liang, Bao Lai1; Liu, Hong-Chao4; Zhang, Su Heng1
2023-04
Source PublicationOptics and Lasers in Engineering
ISSN0143-8166
Volume163Pages:107474
Abstract

We present single-pixel phase microscopy (SPPM) without 4f system, as a novel common-path quantitative phase imaging method, to acquire the amplitude and phase of any transmissive object. To get rid of the 4f system and make the experimental setup more compact and practical, SPPM adopts the phase-modulated detection mode. A single microscopy objective is employed for image magnification, and a collecting lens is used to circumvent the quadratic phase factor introduced by the objective. A phase-only liquid crystal on silicon is utilized to modulate the phase of object light to achieve Hadamard basis scan phase imaging and Fourier basis scan phase imaging with a single photomultiplier tube. We apply SPPM to observe several different types of objects, from simple artificial objects to complex biological specimens. The experimental results show that SPPM provides clear imaging, accurate phase, and spatial resolution up to 2.19 µm (a spatial frequency of 456 lp/mm). Without the 4f system, SPPM can be implemented as an add-on module to existing optical microscopy, which facilitates its adoption in biomedical science and optical metrology.

KeywordSingle-pixel Imaging Quantitative Phase Imaging Microscopy
DOI10.1016/j.optlaseng.2023.107474
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaOptics
WOS SubjectOptics
WOS IDWOS:000925259000001
PublisherELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
Scopus ID2-s2.0-85147124302
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Document TypeJournal article
CollectionINSTITUTE OF APPLIED PHYSICS AND MATERIALS ENGINEERING
Corresponding AuthorLiang, Bao Lai; Liu, Hong-Chao; Zhang, Su Heng
Affiliation1.Hebei Key Laboratory of Optic-Electronic Information and Materials, College of Physics Science & Technology, Hebei University, Baoding, 071002, China
2.Photonics Information Innovation Center, Hebei Provincial Center for Optical Sensing Innovations, College of Physics Science & Technology, Hebei University, Baoding, 071002, China
3.Department of Physics, Yantai University, Yantai, 264005, China
4.Institute of Applied Physics and Materials Engineering, University of Macau, Taipa, Avenida da Universidade, Macao SAR, China
Corresponding Author AffilicationINSTITUTE OF APPLIED PHYSICS AND MATERIALS ENGINEERING
Recommended Citation
GB/T 7714
Zhao, Ya Nan,Hou, Hong Yun,Han, Jia Cheng,et al. Single-pixel phase microscopy without 4f system[J]. Optics and Lasers in Engineering, 2023, 163, 107474.
APA Zhao, Ya Nan., Hou, Hong Yun., Han, Jia Cheng., Gao, Shan., Cui, Sheng Wei., Cao, De Zhong., Liang, Bao Lai., Liu, Hong-Chao., & Zhang, Su Heng (2023). Single-pixel phase microscopy without 4f system. Optics and Lasers in Engineering, 163, 107474.
MLA Zhao, Ya Nan,et al."Single-pixel phase microscopy without 4f system".Optics and Lasers in Engineering 163(2023):107474.
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