This paper presents a type-II reference-sampling (RS) phase-locked loop (PLL) exploiting a novel gain-boosting reference-sampling phase detector (RSPD) to reduce the in-band phase noise and RMS jitter. The proposed gain-boosting RSPD converts the phase error to the voltage error and utilizes a passive switched-capacitor voltage multiplier to amplify the sampled voltage error, which effectively increases the gain of the RSPD. The boosted RSPD gain helps suppress the phase noise contributed from the gm cell. To prevent the transistors in the gain-boosting RSPD and gm cell from breakdown, the gain-boosting function is only activated during the locked state when the phase and voltage errors are small. The switching between the gain-boosting and normal modes is realized automatically by monitoring the sampled voltage and comparing it with a pre-defined threshold window. Fabricated in 65-nm CMOS, the type-II RS-PLL measures an RMS jitter of 54 fs at 6.75 GHz and consumes 7.1 mW, corresponding to a jitter figure-of-merit (FoMjitter) of -256.8 dB. The measured reference spur is -62.6 dBc, and the active area is 0.25 mm2.