This paper presents a high-current calibration-free analog-digital hybrid controlled LDO for large-area digital load. The proposed architecture has the advantages of an analog controller (continuous and high DC accuracy) with distributed digital power transistors (flexible and scalable for high current applications). Distinctive from the conventional digital LDOs that directly quantize the output voltage, the proposed LDO utilizes an error amplifier (EA) to pre-amplify the V $_{\mathrm{OUT}}$ error. Then, a 5-bit time-to-digital converter (TDC) quantizes the processed analog error signal subsequently transformed into a thermometer code that directly controls the distributed digital power transistors. This design can pull off high DC accuracy even without calibration. Besides, we implement an auxiliary constant current (ACC) circuit to solve reliability issues and to improve the stability under a large voltage dropout. Fabricated in a 28-nm bulk CMOS process with a 1.2-A load capability, the proposed LDO achieves 2- $\mu$ V/mA load regulation and close to 1.5% output accuracy. By employing a wide bandwidth EA and a fast TDC, the hybrid LDO can obtain a fast transient response. The measured undershoot is 70 mV with a 0.6-A load step within 10-ns edge time, and the output voltage can scale from 0.6 V to 0.9 V within 30 ns.