Design of microwave lumped and transversal bandpass filter with noise reduction

doi:10.1002/mop.21551

UM > Faculty of Science and Technology > DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING

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Status	已發表Published
	Design of microwave lumped and transversal bandpass filter with noise reduction
	Wai‐Wa Choi; Kam‐Weng Tam; Rui Martins
	2006-04-12
Source Publication	Microwave and Optical Technology Letters
ISSN	0895-2477
Volume	48 Issue:6 Pages:1161-1164
Abstract	A simple design technique for a microwave lumped and transversal filter using constant-k filter sections is presented. The noise figure can be suppressed by source degeneration inductors, which are added to the transversal element. The filter elements are analytically derived based on the specification and the noise minimization.
Keyword	Transversal Filters Noise Reduction Constant-k Filter Source Degeneration Inductor
DOI	10.1002/mop.21551
URL	View the original
Indexed By	SCIE
Language	英語English
WOS Research Area	Engineering ; Optics
WOS Subject	Engineering, Electrical & Electronic ; Optics
WOS ID	WOS:000237444700047
Scopus ID	2-s2.0-33646546055
Fulltext Access	View Full-Text via DOI View Full-Text via Web of Science View Full-Text via Scopus
Citation statistics
Document Type	Journal article
Collection	DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Affiliation	Wireless Communication Laboratory, Faculty of Science and Technology, University of Macau, Macau, China
First Author Affilication	Faculty of Science and Technology
Recommended Citation GB/T 7714	Wai‐Wa Choi,Kam‐Weng Tam,Rui Martins. Design of microwave lumped and transversal bandpass filter with noise reduction[J]. Microwave and Optical Technology Letters, 2006, 48(6), 1161-1164.
APA	Wai‐Wa Choi., Kam‐Weng Tam., & Rui Martins (2006). Design of microwave lumped and transversal bandpass filter with noise reduction. Microwave and Optical Technology Letters, 48(6), 1161-1164.
MLA	Wai‐Wa Choi,et al."Design of microwave lumped and transversal bandpass filter with noise reduction".Microwave and Optical Technology Letters 48.6(2006):1161-1164.

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